Phone: (732)445-5474
E-mail: mjeong@rci.rutgers.edu
Office Location: Busch Campus, CoRE Building, Rm 204
Personal Homepage
http://www.rci.rutgers.edu/~mjeong

Bio

Dr. Myong-K. (MK) Jeong is an Assistant Professor in the Department of Industrial and Systems Engineering and the Center for Operations Research, Rutgers University. He received BS in industrial engineering from Han Yang University, Seoul, Korea, in 1991, MS in industrial engineering from Korea Advanced Institute of Science and Technology, Taejon, Korea, in 1993, MS in Statistics and Ph.D. in Industrial and Systems Engineering from the Georgia Institute of Technology, Atlanta, Georgia, in 2002 and 2004, respectively. He was an Assistant Professor in the Department of Industrial and Information Engineering, the University of Tennessee, Knoxville from June 2004 to June 2008. He worked as a senior researcher for six years at the Electronics and Telecommunications Research Institute in Korea, where he had worked on the performance evaluation and economic analysis of telecommunications systems.

Research Interest

Dr. Myong-K. (MK) Jeong's research interests include statistical data mining, optimization techniques for data mining, machine health monitoring, sensor fusion for manufacturing systems, and process monitoring.

Professional Activities

• Associate Editor for the International Journal of Quality, Statistics and Reliability
• Council Member of INFORMS Quality, Statistics, and Reliability (QSR) Society
• Program committee on several conferences such as the International Conference on Intelligent Computing
• Member of IIE, INFORMS, IEEE, and SME
  

Honors & Awards

• National Science Foundation (NSF) CAREER Award, 2007-2012
• Freund International scholarship, American Society of Quality (ASQ), 2002
• NAFSA Awards for Excellent International Students by Association of International Educators, 2001-2002
• INFORMS 2003 QSR Best Student Paper Competition Finalist
  

Representative Publications
 
F. Yi and M. K. Jeong (2008), “Robust Probabilistic Multivariate Calibration Models,” Technometrics

J. S. Fenner, M. K. Jeong, and J. C. Lu (2008), "Bayesian Parallel Multi-Stage Model for Uniformity Modeling," IIE Transaction on Quality and Reliability, 40(11).

Y. Jeong, S. J. Kim, and M. K. Jeong (2008), “Automatic Identification of Defect Patterns in Semiconductor Wafer Maps Using Spatial Correlogram and Dynamic Time Warping,” IEEE Transaction on Semiconductor Manufacturing System, 21(3).

N. Labbe, H. Cho, M. K. Jeong, and N. Andre (2008), “Enhanced Discrimination and Calibration of Biomass NIR Data Using Nonlinear Kernel Methods,” Bioresource Technology Journal, 99(17), 8445-8452.

H. Cho, S. B. Kim, M. K. Jeong, Y. Park, T. R. Ziegler, and D. P. Jones (2008), “Discovery of Metabolite Features for the Modeling and Analysis of High-Resolution NMR Spectra” International Journal of Data Mining and Bioinformatics, 2(2), 176-192.

M. K. Jeong, J. C. Lu, W. Zhou, and S. K. Ghosh (2007), “Data Reduction Method for Spatial Data Using a Structured Wavelet Model,” International Journal of Production Research, 45(10), 2295-2311

Z. Du, M. K. Jeong, and S. Kong (2007), “Band Selection of Hyperspectral Images for Automatic Poultry Tumor Detection,” IEEE Transactions on Automation Science and Engineering, 4(3), 332-339.

O. Omitaomu, M. K. Jeong, A. Badiru, and J. W. Hines (2006), “On-line Prediction of Motor Shaft Misalignment Using Fast Fourier Transform Generated Spectra Data and Support Vector Regression,” ASME Transactions, Journal of Manufacturing Science and Engineering, 128 (4), 1019-1024.

U. Jung, M. K. Jeong, and J. C. Lu (2006), “A Vertical-Energy-Thresholding Procedure for Data Reduction with Multiple Complex Curves,” IEEE Transactions on Systems, Man, Cybernetics, Part B, 36(5), 1128-1138.

M. K. Jeong, J. C. Lu, X. Huo, B. Vidakovic, and D. Chen (2006), "Wavelet-based Data Reduction Techniques for Process Fault Detection," Technometrics, 48(1), 26-40.

M. K. Jeong, J. C. Lu, and N. Wang (2006), "Wavelet-Based SPC Procedure for Complicated Functional Data," International Journal of Production Research, 44(4), 729- 744.

M. K. Jeong, M. Perry, and C. Zhou (2005), "Throughput Gain with Parallel Flow in Automated Flow Lines," IEEE Transactions on Automation Science and Engineering, 2(1), 84-86.

J. S. Fenner, M. K. Jeong , and J. C. Lu (2005), "Optimal Automatic Control of Multistage Production Processes," IEEE Transaction on Semiconductor Manufacturing System, 18(1), 94-103.

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